Microstructure and interfacial chemistry of pure and La-doped BiFeO₃ thin films.
Identifieur interne : 000545 ( Main/Exploration ); précédent : 000544; suivant : 000546Microstructure and interfacial chemistry of pure and La-doped BiFeO₃ thin films.
Auteurs : RBID : pubmed:24133020Abstract
We report on the microstructure and interfacial chemistry of thin films of pure and La-doped multiferroic bismuth ferrite (Bi1-x Lax FeO3 or BLFO), synthesized on Indium Tin Oxide-coated glass substrates by solution-deposition technique and studied using scanning transmission electron microscopy. Our results show that undoped and La-doped thin films are polycrystalline with distorted rhombohedral structure without any presence of any line or planar defect in the films. In addition, the films with La doping did not show any structural change and maintain the equilibrium structure. Cross section compositional analysis using X-ray energy dispersive spectrometry did not reveal either any interdiffusion of chemical species or formation of reaction product at the film-substrate interface. However, a closer examination of the microstructure of the films shows tiny pores along with the presence of approximately 2-3 nm thin amorphous layers, which may have significant influence on the functional properties of such films.
DOI: 10.1002/jemt.22302
PubMed: 24133020
Links toward previous steps (curation, corpus...)
Le document en format XML
<record><TEI><teiHeader><fileDesc><titleStmt><title xml:lang="en">Microstructure and interfacial chemistry of pure and La-doped BiFeO₃ thin films.</title><author><name sortKey="Basu, Joysurya" uniqKey="Basu J">Joysurya Basu</name><affiliation wicri:level="1"><nlm:affiliation>Materials Synthesis & Structural Characterization Division, Physical Metallurgy Group Indira Gandhi Center for Atomic Research, Kalpakkam, 603102, Tamil Nadu, India.</nlm:affiliation><country xml:lang="fr">Inde</country><wicri:regionArea>Materials Synthesis & Structural Characterization Division, Physical Metallurgy Group Indira Gandhi Center for Atomic Research, Kalpakkam, 603102, Tamil Nadu</wicri:regionArea></affiliation></author><author><name sortKey="Katoch, Rajesh" uniqKey="Katoch R">Rajesh Katoch</name></author><author><name sortKey="Garg, Ashish" uniqKey="Garg A">Ashish Garg</name></author><author><name sortKey="Barry Carter, C" uniqKey="Barry Carter C">C Barry Carter</name></author></titleStmt><publicationStmt><date when="2013">2013</date><idno type="RBID">pubmed:24133020</idno><idno type="pmid">24133020</idno><idno type="doi">10.1002/jemt.22302</idno><idno type="wicri:Area/Main/Corpus">000358</idno><idno type="wicri:Area/Main/Curation">000358</idno><idno type="wicri:Area/Main/Exploration">000545</idno></publicationStmt></fileDesc><profileDesc><textClass></textClass></profileDesc></teiHeader><front><div type="abstract" xml:lang="en">We report on the microstructure and interfacial chemistry of thin films of pure and La-doped multiferroic bismuth ferrite (Bi1-x Lax FeO3 or BLFO), synthesized on Indium Tin Oxide-coated glass substrates by solution-deposition technique and studied using scanning transmission electron microscopy. Our results show that undoped and La-doped thin films are polycrystalline with distorted rhombohedral structure without any presence of any line or planar defect in the films. In addition, the films with La doping did not show any structural change and maintain the equilibrium structure. Cross section compositional analysis using X-ray energy dispersive spectrometry did not reveal either any interdiffusion of chemical species or formation of reaction product at the film-substrate interface. However, a closer examination of the microstructure of the films shows tiny pores along with the presence of approximately 2-3 nm thin amorphous layers, which may have significant influence on the functional properties of such films.</div></front></TEI><pubmed><MedlineCitation Owner="NLM" Status="In-Process"><PMID Version="1">24133020</PMID><DateCreated><Year>2013</Year><Month>11</Month><Day>18</Day></DateCreated><Article PubModel="Print-Electronic"><Journal><ISSN IssnType="Electronic">1097-0029</ISSN><JournalIssue CitedMedium="Internet"><Volume>76</Volume><Issue>12</Issue><PubDate><Year>2013</Year><Month>Dec</Month></PubDate></JournalIssue><Title>Microscopy research and technique</Title><ISOAbbreviation>Microsc. Res. Tech.</ISOAbbreviation></Journal><ArticleTitle>Microstructure and interfacial chemistry of pure and La-doped BiFeO₃ thin films.</ArticleTitle><Pagination><MedlinePgn>1304-9</MedlinePgn></Pagination><ELocationID EIdType="doi" ValidYN="Y">10.1002/jemt.22302</ELocationID><Abstract><AbstractText>We report on the microstructure and interfacial chemistry of thin films of pure and La-doped multiferroic bismuth ferrite (Bi1-x Lax FeO3 or BLFO), synthesized on Indium Tin Oxide-coated glass substrates by solution-deposition technique and studied using scanning transmission electron microscopy. Our results show that undoped and La-doped thin films are polycrystalline with distorted rhombohedral structure without any presence of any line or planar defect in the films. In addition, the films with La doping did not show any structural change and maintain the equilibrium structure. Cross section compositional analysis using X-ray energy dispersive spectrometry did not reveal either any interdiffusion of chemical species or formation of reaction product at the film-substrate interface. However, a closer examination of the microstructure of the films shows tiny pores along with the presence of approximately 2-3 nm thin amorphous layers, which may have significant influence on the functional properties of such films.</AbstractText><CopyrightInformation>Copyright © 2013 Wiley Periodicals, Inc.</CopyrightInformation></Abstract><AuthorList CompleteYN="Y"><Author ValidYN="Y"><LastName>Basu</LastName><ForeName>Joysurya</ForeName><Initials>J</Initials><Affiliation>Materials Synthesis & Structural Characterization Division, Physical Metallurgy Group Indira Gandhi Center for Atomic Research, Kalpakkam, 603102, Tamil Nadu, India.</Affiliation></Author><Author ValidYN="Y"><LastName>Katoch</LastName><ForeName>Rajesh</ForeName><Initials>R</Initials></Author><Author ValidYN="Y"><LastName>Garg</LastName><ForeName>Ashish</ForeName><Initials>A</Initials></Author><Author ValidYN="Y"><LastName>Barry Carter</LastName><ForeName>C</ForeName><Initials>C</Initials></Author></AuthorList><Language>eng</Language><PublicationTypeList><PublicationType>Journal Article</PublicationType><PublicationType>Research Support, Non-U.S. Gov't</PublicationType></PublicationTypeList><ArticleDate DateType="Electronic"><Year>2013</Year><Month>10</Month><Day>17</Day></ArticleDate></Article><MedlineJournalInfo><Country>United States</Country><MedlineTA>Microsc Res Tech</MedlineTA><NlmUniqueID>9203012</NlmUniqueID><ISSNLinking>1059-910X</ISSNLinking></MedlineJournalInfo><CitationSubset>IM</CitationSubset><KeywordList Owner="NOTNLM"><Keyword MajorTopicYN="N">electron microscopy</Keyword><Keyword MajorTopicYN="N">oxide</Keyword><Keyword MajorTopicYN="N">sol-gel growth</Keyword><Keyword MajorTopicYN="N">thin film</Keyword></KeywordList></MedlineCitation><PubmedData><History><PubMedPubDate PubStatus="received"><Year>2013</Year><Month>8</Month><Day>28</Day></PubMedPubDate><PubMedPubDate PubStatus="revised"><Year>2013</Year><Month>9</Month><Day>25</Day></PubMedPubDate><PubMedPubDate PubStatus="accepted"><Year>2013</Year><Month>10</Month><Day>4</Day></PubMedPubDate><PubMedPubDate PubStatus="aheadofprint"><Year>2013</Year><Month>10</Month><Day>17</Day></PubMedPubDate><PubMedPubDate PubStatus="entrez"><Year>2013</Year><Month>10</Month><Day>18</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="pubmed"><Year>2013</Year><Month>10</Month><Day>18</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate><PubMedPubDate PubStatus="medline"><Year>2013</Year><Month>10</Month><Day>18</Day><Hour>6</Hour><Minute>0</Minute></PubMedPubDate></History><PublicationStatus>ppublish</PublicationStatus><ArticleIdList><ArticleId IdType="pubmed">24133020</ArticleId><ArticleId IdType="doi">10.1002/jemt.22302</ArticleId></ArticleIdList></PubmedData></pubmed></record>Pour manipuler ce document sous Unix (Dilib)
EXPLOR_STEP=IndiumV2/Data/Main/Exploration
HfdSelect -h $EXPLOR_STEP/biblio.hfd -nk 000545 | SxmlIndent | more
Ou
HfdSelect -h $EXPLOR_AREA/Data/Main/Exploration/biblio.hfd -nk 000545 | SxmlIndent | more
Pour mettre un lien sur cette page dans le réseau Wicri
{{Explor lien
|wiki= *** parameter Area/wikiCode missing ***
|area= IndiumV2
|flux= Main
|étape= Exploration
|type= RBID
|clé= pubmed:24133020
|texte= Microstructure and interfacial chemistry of pure and La-doped BiFeO₃ thin films.
}}
Pour générer des pages wiki
HfdIndexSelect -h $EXPLOR_AREA/Data/Main/Exploration/RBID.i -Sk "pubmed:24133020" \
| HfdSelect -Kh $EXPLOR_AREA/Data/Main/Exploration/biblio.hfd \
| NlmPubMed2Wicri -a IndiumV2
| This area was generated with Dilib version V0.5.76. |  |